The modern FE-SEM requires not only high performance but also a multitude of functionalities including wide-area observation, in-situ analysis, variable pressure, high-resolution imaging at low accelerating voltages, and simultaneous multi-signal collection.
The SU7000 is designed to address these aspects and more by delivering enhanced information for diversified needs in the field of electron microscopy.
Experience the nano-world with the SU7000!

Specifications:

• Spatial resolution (SE);  0.8 nm at 15 kV, 0.9 nm at 1 kV
• Accelerating voltages- 0.1 kV ~ 30 kV (0.01 kV step)
• Specimen movable stage range -
  • X : 0 ~ 135 mm
  • Y : 0 ~ 100 mm
  • Z : 1.5 ~ 40 mm
  • T : -5 ~ 70˚
  • R: 360˚ 
• Magnification range- 20 ~ 2,000,000 x

Features:

• Multi-Channel Imaging
  • The number of the detectors mounted on the SEM is ever increasing, along with the need to display all collected information effectively.
    The SU7000 is capable of processing, displaying, and saving up to 6 signals simultaneously to maximize information acquisition.
• Wide Variety of Observation Techniques
  The specimen chamber and the vacuum system are optimized for:
  • Large specimen size
  • Sample manipulation at various axes
  • Variable pressure conditions
  • Cryogenic conditions
  • Heating and cooling in-situ observation
•  Microanalysis
  The electron gun is equipped with a Schottky emitter that provides up to 200 nA beam current to accommodate various microanalysis applications.
  The specimen chamber and port layout are designed to incorporate multiple analytical options including EDX, EBSD, cathodoluminescence, and more.
  The SU7000 with the combination of numerous analytical accessories unifies multi-discipline techniques in a single platform
  
  
  • Energy dispersive x-ray microanalysis system (Ultim40, Oxford Instruments., Abingdon, UK)
  • Electron Backscatter Diffraction (C-Nano, Oxford Instruments., Abingdon, UK)